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Flash SSD Power Failure Corruption Prevention, Recovery and Test - Part 1

Posted by John Kuracek on Tuesday, 06 May 2014

Electronic systems are often vulnerable to power disruptions. Voltage spikes, brownouts, surges, blackouts and other power supply fluctuations destabilize system operation with typically unpredictable results. In general, once a power spike is detected, a system is reset to revert back to an expected and default condition.

The same is not true with the memory systems. Since the memory system could be in the middle of the memory update process during the power disruption, not only can the user data be changed during the power spike, but more importantly, the reset default condition may be corrupted and destroyed. In such catastrophic event of system file corruption, the memory system information could be completely unrecoverable and the whole electronic system would become non-functional.

Therefore it’s of ultimate importance to properly design and thoroughly test the memory system response to the power disruption to prevent user data corruption and more importantly corruption of the default system conditions.

Fortasa Memory Systems products have integrated robust technical features to detect power disruption, prevent damage to the stored data and gracefully recover to a predictable condition after a power failure. Complementing Fortasa’s power recovery technology with the proper host system design techniques would practically eliminate the risk of memory system damage due to power disturbance. And finally, combining the advanced embedded protection technology inside the storage system with additional host system power protection design techniques and verifying reliable operation through extensive system level comprehensive pre-production tests would guaranty the most reliable product operation in the most critical end-applications.